Abstract :
In this present study, wurtzite CZTS nanocrystals have been prepared by a sol–gel route associated to spin coating
for different molar concentrations in the precursor solution. The CZTS samples have been characterized structurally by Xray diffraction (XRD), and the surface morphology of the thin films has been studied by using atomic force microscopes (AFM).XRD result reveal a wurtzite structure with preferred orientation along (100) to all sample, and the intensity of the peaks increased with the solution concentration increased, and the increasing molar concentrations led to an increase in the grain size, whereas dislocation density and micro strain decreases with the increase of molar concentrations. the secondary phases were observed due to the sulfur ratio used to prepare the thin film to avoid material decrease during preparation.AFM result shows. The roughness of the surface (RS) and the root mean square (RMS) values were increase with increasing of molar concentrations.
Author Name : Fatmah W.Redha, Rafea A. Munef & Ali I. Salih
DOI: https://doi.org/10.5281/zenodo.1034824
Keywords: Cu2ZnSnS4, Thin films, molar concentrations, Sol-Gel method, Structural Properties.
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